Product novelty 28. April 2026

TopMap Micro.View® is the compact, table-top profiler of the TopMap line of areal scanning white-light interferometers. It enables repeatable, high-resolution surface inspections of microstructures, texture, surface form and roughness parameters (Sa, Sz, ...). Scan your surfaces quickly and with sub-nm resolution!

With the integrated CST Continuous Scanning Technology, it uses the full 100 mm travel range as measuring scale with vertical resolution down to the nm range. This optical profiler features a compact design with integrated electronics and impresses with its ease of useThe automatic Focus Finder simplifies and speeds up your measurements both in production and test labs.

- Fast, efficient surface and topography analysis of roughness, microstructures and finish
- Compact profiler as table-top system
- 100 mm large vertical travel and measuring range CST for continuous scanning
- Excellent lateral resolution
- Operator Interface for 1-click measurement recipies at production level
- Application-specific accessories
- Measurement with sub-nanometer resolution
- NEW: extended lens options 0.6X ... 111X now available

Contact us for a demo, free feasibility study on your samples or more information!