Control-Expert Day Summits – Fraunhofer’s Insights for the Future of Quality

As a key highlight of the daily programmes, the Control Expert Day Summits will feature special accents on both days of the event: world-class keynote presentations held by experts from the Fraunhofer Institute will address the respective topics of the day in a targeted manner and explore them in depth, drawing on well-founded expertise from both research and actual practice.

Look forward to concise assessments and inspiring food for thought midway through the daily programme, and gain fresh energy for the rest of the day. On the expert stage!

Moderated by Wolfgang Kräußlich, editor-in-chief of trade publication QZ!

The first day of the event will be devoted to the question of how quality management and sustainability can be approached together – and which technologies and methods support businesses to this end.

To an ever-greater extent, increasing product complexity, shorter innovation cycles and ever-stricter quality requirements are pushing traditional manufacturing approaches to their limits. In many cases, the zero-defects concept can no longer be fully implemented in a cost-effective manner.

Against this backdrop, industrial X-ray technology, in particular computer tomography (CT), is emerging as a strategic tool: it facilitates non-destructive, three-dimensional analysis of components and not only helps companies to check quality, but rather to manage it in a targeted fashion too.

The use of CT offers clear advantages – from reduced scrap rates and faster development processes to more stable, data-driven, optimised workflows and greater product reliability for complex components.

Especially in innovation-driven sectors such as battery cell manufacturing, this technology is already indispensable and will play a central role in resilient, sustainable, digital production systems in the future.

Speaker: Dipl. Ing. FH Michael Salamon, group leader for high-energy X-ray systems in the Department of Application-Specific Methods and Systems at the Fraunhofer Institute for Integrated Circuits IIS, X-Ray Technology Development Centre

Moderated by Dr.-Ing. Peter Ebert, Editor-in-Chief of inVISION!

The second day will focus on a topic which is currently changing quality assurance in a fundamental manner: artificial intelligence.

The expert will reveal where AI is already delivering real added value – and which challenges remain.

Artificial intelligence is finding its way more and more into industrial applications and opening up new possibilities … but it also presents challenges. Although quality control is considered its most important application, only around 25% of companies are currently making use of AI technologies.

The presentation explores the opportunities and limitations of AI in industrial quality control, and uses examples to illustrate some of the more flexible solutions which are now possible. At the same time, key challenges are also addressed: for example, the availability of suitable datasets, the transparency of AI decisions and the configuration of parameters for the models.

Specific approaches are used to demonstrate how companies can meet these requirements.

Speaker: Dr. Henrike Stephani, Scientific Advisor for Institute Strategy and Assistant Head of the Image Processing Department at the Fraunhofer Institute for Industrial Mathematics (ITWM)

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