Trade fair highlight 25. April 2023
The next generation optical surface profiler - TopMap Micro.View+
NEXT GENERATION OPTICAL SURFACE PROFILER
TopMap Micro.View+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View + delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces.
Automation enabled and production-ready
The encoded and motorized turret secures a seamless transition between objectives. Micro.View+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation.
High-end white-light interferometer with nm resolution
100 mm z measurement range with CST Continuous Scanning Technology
With Focus Finder and Focus Tracker ready for automation
Motorized X, Y, Z, tip/tilt and turret save repositioning
Color information mode for extended analysis and documentation of defects
Modular, application-specific configurations
TopMap Micro.View+ is the next generation optical surface profiler. Designed for modularity, this comprehensive workstation allows for customized and application-specific configurations. The Micro.View + delivers the most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data visualization of engineered surfaces.
Automation enabled and production-ready
The encoded and motorized turret secures a seamless transition between objectives. Micro.View+ features the latest Focus Finder plus Focus Tracker, keeping the surface in focus at all circumstances. The fully motorized sample positioning stages allow for stitching and automation.
High-end white-light interferometer with nm resolution
100 mm z measurement range with CST Continuous Scanning Technology
With Focus Finder and Focus Tracker ready for automation
Motorized X, Y, Z, tip/tilt and turret save repositioning
Color information mode for extended analysis and documentation of defects
Modular, application-specific configurations
Polytec GmbH
Contact
Mr. Matthias Pauli