Product novelty 28. April 2025

Polytec has launched the unique 0.6X magnification option for the TopMap product line of optical surface profilers, building the bridge between microscopic and macroscopic topography analysis, for form and roughness evaluation. The TopMap Micro.View+ modular profiler already features autofocus and automatic focus tracking including a motorized turret for fast switching and combined measurements – so far with magnifications from 2.5X to 111X. Equipped with the new 0.6X objective, the single field of view extends to 15.53 x 11.71 mm². This means, the profiler not only captures roughness and structural details with eagle eyes, but also measures flatness or shape on larger areas for faster and more efficient inspections without stichting. With a working distance of 9.2 mm, it offers a measurement point spacing of 9.76 µm.

Resolve fine structural details while still covering a large field of view? Contact Polytec!