Product novelty 28. April 2025

Modular optical profiler for 3D roughness and microstructure analysis with sub-nm resolution

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Modular optical profiler for roughness, finish and microstructures with sub nm-resuolution
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Modular optical profiler for roughness, finish and microstructures with sub nm-resuolution
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The TopMap Micro.View+ is the next generation optical 3D profiler from Polytec. Its modular design offers many configurations, forming your custom surface test station - whether for texture, microstructures or roughness on precision-manufactured parts or microsystems. Micro.View+ is designed for research labs as well as for production level, while it allows even head-only integration for in-line surface inspections in manufacturing. Display and visualize your sub-nm resolved 3D topography data for clear interpretation, use the color information mode for meaningful visualization and detailed analysis including reliable defect detection and advanced documentation. The 5 MP camera option records 3D measurement data thoroughly, delivering detailed insights on your surface texture and form, thus allowing feedback and optimization on mechanical engineering or machining processes.

Modular & automated quality inspections in lab, production or in-line
The wide set of accessories simplifies and accelerates your daily surface inspections. Focus Finder and the innovative Focus Tracker keep samples in focus at all times, supporting repositioning and speeding up the measurement. The fully motorized positioning stage supports stitching and automated inspections with automatic adjustments of tip/tilt.
ï‚§ Top of the line white-light interferometer with sub-nm Z resolution
ï‚§ 100 mm vertical measuring range with CST Continuous Scanning Technology
ï‚§ Focus Finder and Focus Tracker ideal for automated production control
ï‚§ Motorized tip-tilt stage and turret for automatic positioning
ï‚§ Operator interface for creating and loading measurement recipes and 1-click solutions at production level
ï‚§ Color mode for professional analysis and documentation of defects
ï‚§ Modular for application-specific configurations
ï‚§ NEW: Extended lens options 0.6X ... 111X now available