Product novelty 29. April 2025
Measure form parameter and topography with large FOV and zero contact
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TopMap Pro.Surf – the Pro model of optical surface profilers (white-light interferometers)
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TopMap Pro.Surf – the Pro model of optical surface profilers (white-light interferometers)
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TopMap Pro.Surf is the optical 3D surface profiler for large-area surface characterization - fast, with interferometric precision. Pro.Surf is the high-end non-contact profiler for reliable quality control in production, whether in-line, at-line or in the lab. Pro.Surf measures flatness, step height or parallelism and more with 44x33 mm large field of view (FoV) for advanced testing efficiency. The white light interferometer scans height data on large areas, thus capturing all surface details in a single shot. Capture >2Million measuring points on a 44 x 33 mm field of view (FoV) within seconds. Extend the image field to 230 x 220 mm by stitching, make full use of the 70 mm vertical measuring range for recessed surfaces and benefit from the outstanding vertical resolution, independent of the magnification. The telecentric optics capture even hard-to-reach and low-lying surfaces, e.g. in drill holes. Numerous add-ons and configuration options make the Pro.Surf your application-specific surface inspection system: Upgrade to a multi-sensor system for large-area measurement of shape plus roughness line profiling. Benefit from integrated software, customizable data acquisition and evaluation tools, create own parameters, use predefined measurement recipes as 1-click solutions on production level, integrate a barcode scanner and more.