Product novelty 08. May 2025
Automated Testing Solution System E-LIT
Thermography system for non-destructive
electronics and semiconductor module testing
The »E-LIT« thermographic inspection system is an automated solution
for non-contact defect inspection of semiconductor materials as well
as electronic components and circuits. The modular system can be used
both early during development and later during ongoing production and
uses methods of lock-in thermography with electrical excitation. This
allows a wide variety of defects to be precisely detected and localized,
such as point and line short circuits or handling, manufacturing and
oxidation defects.
electronics and semiconductor module testing
The »E-LIT« thermographic inspection system is an automated solution
for non-contact defect inspection of semiconductor materials as well
as electronic components and circuits. The modular system can be used
both early during development and later during ongoing production and
uses methods of lock-in thermography with electrical excitation. This
allows a wide variety of defects to be precisely detected and localized,
such as point and line short circuits or handling, manufacturing and
oxidation defects.
InfraTec GmbH
Infrarotsensorik und
Messtechnik
Contact
Ms. Lisa Marie Calow