InfraTec GmbH
Infrarotsensorik und
MesstechnikHall 7 - Stand 7401
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Automated Testing Solution System E-LIT
Thermography system for non-destructive
electronics and semiconductor module testing
The »E-LIT« thermographic inspection system is an automated solution
for non-contact defect inspection of semiconductor materials as well
as electronic components and circuits. The modular system ...more
InfraTec GmbH
Infrarotsensorik und
Messtechnik
